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Apple II KansasFest July 1996
Kansas City, MO Page 1 of 24
APPLE II DIAGNOSTICS: AN EVALUATIVE REVIEW
IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII
V. 1.0
Stephen Buggie OUTLINE
University of New Mexico-Gallup Introduction
200 College Road General Features of Diagnostics
Gallup, NM 87301 ROM Tests
Voice: [505] 863-7504 RAM Tests
Fax: [505] 863-7644 Keyboard and Monitor Tests
buggie@unm.edu Software Review
Reference
Best Diagnostic Routines
Conclusions
MIND (n.) "A mysterious form of matter secreted by the brain;
Its chief activity consists of attempting to understand its
own functions; the futility of the attempt being due to the
fact that it has nothing but itself to understand itself with."
(Ambrose Bierce, THE DEVIL'S DICTIONARY, 1911)
These diagnostics are reviewed:
AE RAM Testers [RamFactor, ZRAM-IIc, Ramworks] (c1988)
Apex II Diagnostics (c1986)
Apple Diagnostics [IIe/IIc/IIgs] (c1990)
AppleCillin II Diagnostics (c1982)
Apple Fixer (c1992)
Applesurance Diagnostic Disk Controller v.3.1 (1982)
Aptest Diagnostics II+/IIe/IIc (c1986)
Bit Banger [IIgs ram tester] (1993)
Certifix IIe/IIc Disk Diagnostics (c1983)
Internal Self-Test IIe/IIc/IIgs (c1985-92)
Master Diagnostics IIe/IIc v. 7.0 (1990)
MECC Computer Inspector v.1.0 (1988)
MultiRam IIe or IIc Diagnostics by CheckMate Technology (1985)
Power Up! Computer Checkup (1984)
RAM-4000 [IIgs RAM tester] (c1993)
Real Diagnostics IIe/IIc (c1989)
Sequential Meg-80Z Memory Tester v. 2.1 (1993)
Tuning Apple II Floppy Drives (1995)
Vitesse Disk Drive Diagnostics (1993)
XPS Diagnostics IIe (1985)
Yo Yo Duck Diagnostics IIe/IIc (c1990)
ZIP CHIP IIe/IIc 8 MHz Diagnostics (c1989)
ZIP-GS Diagnostics (c1991)
INTRODUCTION
DIAGNOSTICS are software programs that test computer hardware. When
things go wrong, the diagnostics can guide repairs by identifying and scaling
problems. Diagnostics have been available since the early heyday of Apple II
computing, but these programs are especially important today. Today, Apple II loyalists may find it difficult or impossible to locate technicians who are willing or capable of fixing our equipment. Thus, to keep our equipment alive and well, we Apple II loyalists must do repairs ourselves or reciprocally for one another.
This paper describes the capabilities of many Apple II diagnostics.
Nearly all of these diagnostics are now out of print, and their publishers
have abandoned their support of the Apple II. I wish to support others who
share my interest in keeping the Apple II alive.
Most of the diagnostics reviewed here apply to the IIe, IIc, and II+.
Few are IIgs-specific. I have IIe, IIc, and IIgs Apples, but have never used a II+. [The II+ computers I have owned were kept briefly as sources of
cannibalized parts]. The IIgs, in IIe emulation mode, can run most of this
software although its RAM banks are arranged differently. II+ users can
benefit from most of this software, especially software packages dated before
1985. In the following sections I have not commented on II+ diagnostics
because I have no way directly to judge II+ compatibility.
GENERAL FEATURES OF DIAGNOSTICS
Each diagnostic package has some special features and these will be
described. But many features are shared in common. Common features will be
described generally here, and notable exceptions in each diagnostic program
will later be identified.
Some features of diagnostic software confirm that the hardware works
properly, but they are of limited value for identifying the problem to be
fixed. In other words, the test verifies that a hardware feature is in
working order, but it does not give sufficient information to guide the
repair. Confirmatory information will be appreciated when buying or selling
the equipment; the buyer wishes to verify that the equipment works. When
breakdown occurs, the program might simply advise the user to seek repairs
from a technician.
RAM testing software is a good example of confirmation-oriented
diagnostics. It is reassuring to note that the RAM tests have been passed and that the RAM memory functions well. But when RAM tests are failed, few
manuals give the user enough information to identify the RAM chip that needs
to be replaced. Also, if one of the eight RAMs in the lower 64K bank were to
fail, the diagnostic disk itself would be completely unplayable!
[Fortunately, the ROM-controlled internal self-test in the IIc and in
late-model IIe computers will identify any bad RAM among the 16 RAMs even if
disks cannot be booted.]
Apple II 5.25" floppy drives are intended to operate with a rotational speed of 300 rpm [5 revolutions/sec]. A DISK SPEED TEST is included in almost all diagnostic packages, for these reasons. First, the mechanical design of early belt-driven 5.25" floppy drives [such as the venerable classic drive, the Disk II] required periodic speed adjustment - about once every 500 hours of use. Half-height 5.25" drives [e.g., Teac, Mitac, Meiji, BMC] which were introduced in the mid-80s typically had self-regulating speed-control circuitry that made frequent speed adjustment unnecessary. Second, drive-related copy protection schemes were used widely by software publishers in the early 1980s, and drive speed irregularities caused much software to crash. In recent years, software copy protection has been abandoned by publishers and by users themselves.
Drive speed should be adjusted as close to 300 rpm as possible. Speed adjustment can be done externally on some drives, but most require partial disassembly [or case removal] to gain access to the speed adjustment set screw. The technique is as follows: [1] Disassemble the drive and locate the speed adjustment screw [at the right-rear interior on full-height drives, and in the bottom analogue card of half-height drives], [2] Load the speed-test program, and insert a formatted blank disk into the drive to be adjusted, [3] with the disk spinning, adjust the speed adjustment set-screw as close as possible to the optimum 300 rpm. If exact adjustment to 300 rpm is not possible, then adjust the speed slightly slow of that mark. [Disk drives prefer to run slightly slow rather than fast.]
Note that speed adjustment is irrelevant to 3.5" drives [Unidisk 3.5,
Apple platinum 3.5, IIc Plus internal 3.5" drive]. The 3.5" drive mechanism
maintains a constant head-speed but not constant rotational speed. As the
head travels from inner- to outer tracks, the rotational speed slows to
maintain constancy in head-travel speed. The complexity of the 3.5"
speed-control algorithm is one reason why Apple II or Mac 3.5" drives have
always been more expensive than the simpler drive mechanism used by IBM [ , 1987].
ROM TEST DIAGNOSTICS:
Many diagnostic packages will do tests on ROM code. Several use ROM
code to identify the computer model [Master Diagnostics, Apex II, Apple Co.
Diagnostics], which is displayed impressively on an opening screen. Test
algorithms might be applied to the ROMs to verify that they work properly. It must be kept in mind that ROMs were frequently updated so ROM diagnostics
created for early versions may yield false "errors" when applied to more
recent versions. For example, four versions of the IIc were produced
[Original IIc, Unidisk 3.5 IIc, Memory Expansion IIc, and the IIc Plus].
Extensive ROM expansions were done with each revision, yet the Aptest IIc ROM
test recognizes only the oldest IIc ROM set; all later ROMs, including those
installed with the factory-recall free upgrade, general false "error"
messages.
RAM MEMORY TESTS:
These are found in most diagnostics. The best RAM tests will identify the location of the bad RAMs: These location-specific testers include: AE RAM testers [RamFactor, ZRAM, RamWorks], Sequential Meg-80Z, and Bit Banger IIgs. Some testers will refuse to test other cards or configurations, while others will execute the tests on any RAM card. If a RAM chip goes bad in the lowest
64K bank, then disk-based RAM diagnostics are useless. But the internal
self-test can always be used, and it will identify the location of any bad RAM chip. Most RAM testers optionally can be set for a single pass or to repeat continuously.
KEYBOARD AND MONITOR TESTS:
Tests of the keyboard or monitor are often included. Keyboard tests
typically display a sketch of the keyboard layout. Screen pictures of keys
change in their brightness as the user presses them. Alternative keyboard
formats [IIgs, IIc, IIc Plus] can also be tested. The monitor tests include
brightness, skewness of lines, high-res, double-hi-res graphics, etc. The
most useful monitor tests are those which help in color adjustments.
Can faulty ICs be identified directly by software tests? In the case
of IIe RAM, the answer depends on which the location of the faulty chip's RAM
bank. Many older (pre-1983) diagnostics are designed to boot with just main
64K bank of memory. Most ProDOS-based software requires 128K of RAM --- both
main and auxiliary memory. Presence of a faulty RAM chip in main memory
(lower 64K was far more handicapping than when the faulty ram was located in
the auxiliary (upper 64K) bank. The internal self-test is highly resilient in coping with damaged RAM ---- it identifies defective RAM chips equally well in either RAM bank.For the next revision of this review, I intend to do a series of motherboard "chip-zapping" tests to determine whether software can identify faulty non-RAM chips. The plan is damage intentionally various chips (CPU, ROM, MMU, etc.) on the motherboard, then to load and run the diagnostics. I was unable to complete these "chip-zapping" experiments beyond a brief pilot study with a faulty RAM chip but will do further tests prior to the next revision of this paper. I suspect that zapped motherboard processors will remain unidentified by software because the software will be unbootable. For example, CPU tests may become unbootable when the CPU itself is seriously damaged. In that event, CPU tests have value for confirming but not for diagnosing the faults.
Reviews of specific diagnostic packages will follow. For each
diagnostic, the main menu screen will be presented, followed by other screens. Special features will be presented where applicable.
===========================================================================
===========================================================================
AE RAM TESTERS (c1982-c1990)
[RamFactor, ZRAM-IIC, RAM EXPRESS-IIC+, RamWorks]
These are fine diagnostics supplied with Applied Engineering RAM
cards. They are copyable, and can be assembled together as a combined set on
a single disk. Each test is for a specific RAM card: the card is shown
graphically with each ram clearly positioned on its outline of the card.
Diagnostics are available for these versions and their variations: (a)
RamFactor (IIe and IIgs slot 1-7), ZRAM (65c02 and MMU socketed RAM card for
IIC models), Ram Express (Socketed RAM card for latest IIC and IIC+), and
RamWorks (IIe auxiliary slot card).
Details of the RAM tests were not specified. Presumably, they would
involve both write to RAM, and read from RAM. Tests repeat endlessly until
stopped. Continuation of the tests is indicated with a simple spoke graphic
that wheels its way across the screen. Bad or unused RAMs are indicated on
the graphic outline with an "X" design. This style of identifying bad RAM is
clear, and is superior to coded indicators. Because the tests are repeated
endlessly, thermal sensitivity of RAM can be judged. Some RAM that initially
passes the tests may later fail following warm-up; such failures due to heat
are identified by these tests. Overall, these are the best RAM tests
available for the IIe, IIc, and IIc+.
=============================================================================
=============================================================================
APEX II DIAGNOSTICS, V. 4.6 [1986]
[Main Menu Screen]
CONFIDENCE TESTING PRINTER TESTS
DISK DRIVE TESTS VIDEO TESTS
RAM TESTS SOUND TESTS
GAME-PORT TESTS CARD TESTS
KEYBOARD TESTING UTILITIES
===========================================================================
APEX II is one of the best 8-bit diagnostic packages, and it is
recommended highly. It includes a well-rounded comprehensive set of tests,
developed for the II+ and early IIe. It also is applicable to later models.
Its disk drive tests are very complete: a graphical drive speed test (a clone
of APTEST), a Disk II drive ROM test, read/write tests, a write-protect switch test, and alignment tests. The alignment tests are of doubtful validity: they resemble APTEST's alignment test, yet their results are inconsistent with APTEST's. The RAM tests also resemble those of APTEST.
The truly distinctive feature of APEX II is its "machine
identification" program. This program identifies the model of the computer,
and also the interface cards residing in slots. Cards are identified by a
checksum routine based on the card's ROMs. My version of APEX presently can
identify about 70 interface cards; these cards are listed in a
user-inspectable card dictionary (listed under the Utilities menu). When an
unfamiliar interface card is detected, the user is asked to identify the card. This identification is then added to the interface card dictionary file. The machine identification program is very helpful to identify unknown interface cards, and also to identify cards without having to "lift the hood" to see them.
APEX II has several utilities to supplement its diagnostics. These
include (COPYA) (fast copier/formatter for unprotected 5.25" disks), a test
result summarizer, and a disk surface verifier. The disk operated smoothly:
it is unprotected, and returns to the main menu or to sub-menus were smooth.
Availability of upgrades beyond v.4.3 is unknown.
APPLE-CILLIN II DIAGNOSTICS XPS INC. (1982)
[Main Menu Screen]
1 - RAM MEMORY 5 - LINK GROUP OF TESTS
2 - ROM MEMORY 6 - SET/CLEAR RESULT PRINT-OUT
3 - DISK II SYSTEM X - END TEST SESSION
4 - OTHER TESTS
[OTHER TESTS Menu Screen] [Disk II Menu Screen]
O - PERIPHERAL CARDS H - FORMAT DISK
P - KEYBOARD I - SEQUENTIAL READ
Q - C R T [monitor] J - SEQUENTIAL WRITE/READ
R - PRINTER K - RANDOM READ
S - TAPE SYSTEM [cassette] L - RANDOM WRITE/READ
T - GAME CONTROLS [joystick] M - TRACK SEEK
U - C P U N - DRIVE SPEED
X - BACK TO MAIN MENU X - BACK TO MAIN MENU
This disk predates the IIe, IIc, and IIgs, and its tests were made
for the II+. The disk was produced by XPS Inc., a company that later
released the XPS Diagnostic disk for the IIe and IIc. A similar sequel was
released in 1984 under the name of Power Up Computer Checkup.
Tests are launched by selecting them from the menus, then pressing
the "S" key to get them started. Prompts appear to remind the user how to
get each routine started.
Apple-Cillin has a very unique "Tape System" routine, to test the
cassette write/read ports on the II+ and IIe. (Someday I might test this
function --- I missed the early years of Apple II computing when cassettes
were used for mass storage.) Most of Apple-Cillin's tests will work on the
IIe and IIc. For example, the CPU test was intended for the 6502 but it
works fine with the IIc's 65c02.
The Disk II routine is outlined by its menu, reproduced above. This
routine has several variations for testing writing/reading to/from the disk.
Errors in speed, writing, reading, track seeking are identified. These
tests work well, and should be done if head-positioning problems with drives
are suspected. In the random write/read test, the head is dragged quickly
back and forth, so head-positioning faults will be identified. When
testing, be sure that the program disk is removed from drive 1; otherwise,
it could be erased accidentally.
The RAM-tests can be applied selectively to low- vs. high addresses.
While in progress, a spinning odometer remains in motion. RAM chips are
identified as either "G" (good) or "B" (bad), within each series of eight
RAM chips. Flagging of defective RAMs was not seen because my IIc's RAMs
are all good. the number of successively repeating RAM tests is indicated.
on the screen. RAM tests proceed continually until stopped by a press of
the ESC key.
ROM tests can be applied selectively to any of these: motherboard,
II+ Slot #0, or to expansion ROMs. But the ROM tests are especially
directed towards the IIc. In my Unidisk 3.5 IIc, only the AppleSoft ROM was
recognized, all others were judged, "unknown." The "peripheral cards" test
does not apply to the IIc. Only one IIc port was recognized by the
software.
The CPU-test routine works with the 65c02 as well as the older 6502.
It is text-based, and a series of specific subroutine tests are displayed
with the words, "tests good." (One wonders whether the disk even load to
run this test if the CPU were bad.)
The Peripheral Cards test is virtually inappropriate for the IIc.
Only one port, #7, was recognized by Apple-Cillin. Although that port was
recognized, it was not evaluated by the software.
Monitor tests are extensive, and particular still patterns or colors
can be displayed.
Transition from tests back to the main menu is generally smooth,
although the machine will hang when exiting from some tests. In that case,
the computer must be rebooted. Tests can be linked together, and the
results can be printed at the user's option. The disk is copy-protected but
it can be backed up reliably by applying the bit-copier from Locksmith 4.1.
In summary, this disk is old. Its functions were modest by modern
standards, and they were superseded by later software. But its disk drive
diagnostic test has a few features not found elsewhere. Tests such as the
CPU routine and parts of the Disk II test are unique.
===========================================================================
===========================================================================
THE APPLE FIXER (c1992)
by Adrian Vance
(AV Systems, Santa Barbara CA)
This software is recent and is currently supported by its author,
who is a regular correspondent on comp.sys.apple2. AV Systems offers a
range of Apple software products aimed mainly at educational users.
Regrettably, my disk is temporarily misplaced. A full review of THE APPLE
FIXER will be given in the next revision of this paper. I recall that it
has a simple but attractive opening screen graphic, and that a modest array
of standard tests (drive speed, etc.) are offered.
===========================================================================
===========================================================================
APPLESURANCE DIAGNOSTIC DISK CONTROLLER, V.3.1 (1982)
(SCREEN MENU, ENHANCED IIE)
LOCN CHKSM ID PROC TEST DONE
--------------------------- -------------------------
DO 98EF A APPLESURANCE V.3.1
D8 CAED A APPLE IIE
E0 EC0B A QUICK TEST:
E8 5A09 A MAIN RAM 0E
F0 520D A HIGH RAM 0E
F8 3EE3 A ALT BANK 0E
This diagnostic differs from all others because it is ROM firmware
implanted on a Disk II-style floppy disk interface card. I have two of
them, marketed under these names: ALBERT COMPUTER DIAGNOSTIC DISK
CONTROLLER (1982). It is also sold under the name of
-------------------------.
The diagnostics are simple: identification of a checksum on six
ROMS, and a simple RAM test applied separately to main RAM (lower 64K), then
to high ram (upper 64K), and finally to ALT BANK (extended RAM). The ROM
checksums listed here are for the enhanced IIe; if yours differ from the
stated checksums stated above, then you must judge that your IIe is
unenhanced. 8-(
These are few diagnostic tests, but they are done
frequently-whenever the computer is powered up. The display fits within a
single screen. Thus, little is done but what is done, is frequently seen.
The diagnostic appears quickly on the monitor and remains displayed
for two or three minutes. Disk booting is not delayed; the boot continues
while the diagnostics screen is displayed.
===========================================================================
===========================================================================
APTEST DIAGNOSTICS [Call Apple, c1985]
=======================================
[Main Menu Screen: IIe]
1. APPLE IIE ROM TEST 8. KEYBOARD TEST
2. 48K RAM TEST - ONE PASS 9. PADDLE/JOYSTICK TEST
3. 48K RAM TEST - REPEATING A. SERIAL PORT TEST
4. TOP 16K TEST - ONE PASS B. MODEM TEST
5. TOP 16K TEST - REPEATING C. EIGHTY COLUMN CARD TEST
6. DISK SPEED TEST D. AUX RAM CARD TEST - ONE PASS
7. DISK INTERFACE TEST E. AUX RAM CARD TEST - REPEATING
[Main Menu Screen, IIc]
THE APPLE TASTER
1. APPLE IIc ROM TEST 8. KEYBOARD TEST
2. 48K RAM TEST - ONE PASS 9. PADDLE/JOYSTICK TEST
3. 48K RAM TEST - REPEATING A. SERIAL PORT TEST
4. TOP 16K TEST - ONE PASS B. MODEM TEST
5. TOP 16K TEST - REPEATING C. EIGHTY COLUMN CARD TEST
6. DISK SPEED TEST D. AUX RAM CARD TEST - ONE PASS
7. DISK INTERFACE TEST E. AUX RAM CARD TEST - REPEATING
This disk was produced by CALL A.P.P.L.E., a large users' group.
John Kohn (Shareware Solutions II) reported in December 1995 that the
copyright owner has released this disk into the public domain, so it is
freely copyable.
APTEST is menu-driven, and there is easy return to the main menu from
most (but not all) subdirectory screens It has interesting full-screen
repetitive inverse-flashing patterns for its RAM tests. Its age is evident
(c1982) in some of the tests, such as the diagnostics for the 300 baud
Micromodem II by Hayes. Different main menu screens pop up for the IIe vs.
IIc. Absent from the IIc menu screen is the track-centering realignment
programs and their brief accompanying docs. (IIc users can still tune their
drives by recopying the alignment-related files onto a separate disk; See my
disk-document, TUNING APPLE II FLOPPY DRIVES, for further details.
The best programs on APTEST are those for track-centering alignment.
These is also an excellent gauge-centering drive-speed tester, equal in
quality and style to the drive-speed tester on Nikrom Master Diagnostics
IIc/IIe. The drive-speed tester scales both the direction (+/-) and extent
of speed deviation from the desired 299 rpm.
===========================================================================
===========================================================================
APPLE DIAGNOSTICS V.3.0
=======================
[Main Menu Screen: IIc] [Choose Tests Screen: IIc]
a. EXECUTE ALL DIAGNOSTIC TESTS a. ROM/ CPU TEST
b. EXECUTE SELECTED TESTS b. SYSTEM INTERRUPTS TEST
c. CHOOSE TESTS [FOLDER] c. MMU/ IOU TEST
d. OPTIONS d. RAM TESTS
e. SPECIAL e. SERIAL PORTS TESTS
f. QUIT f. DISK PORT TESTS
g. SOUND CIRCUITRY TESTS
h. VIDEO PATTERN TESTS
i. KEYBOARD/ MOUSE TESTS
[Options Menu: IIc] [Special Menu: IIc]
a. Loop Tests until ESC is Pressed a. DISPLAY ERROR LOG
b. Continue on Error Until ESC b. CLEAR ERROR LOG
c. CLEAR TESTING STATUS LINE
d. DISPLAY CURRENT SYSTEM STATUS
e. LOAD SELECTED TEST SEQUENCE FROM
DISK
f. SAVE SELECTED TEST SEQUENCE TO
DISK
This is a diagnostic disk provided by Apple, apparently for use by
its technicians. It has several unique features. (a) Like other
diagnostics (Aptest, Mecc Computer Inspector), the software instantly
recognizes (from ROM code) the computer model. Specific tests relevant to
the model are then arrayed on the menu screen. (b) Like Yo Yo Duck, the
tests can be linked for continuous long-term testing. (c) An
Appleworks-style folder screen is used, so users who are familiar with
Appleworks can use the disk even if the manual is unavailable.
The sophistication of its tests is intermediate --- more
sophisticated than Yo Yo Duck, yet less advanced than Master Diagnostics.
But users can typically identify their computer's suspected problem area
(e.g., RAM), and these tests can be selected to repeat indefinitely.
The software is compiled on a single 3.5" disk, bootable and
recognizable by various Apple IIs: IIe, IIc, IIc Plus, IIgs. The disk is
formatted in ProDOS, so specific routines can be recopied freely to other
disks. For example, IIe or IIc users can recopy the programs relevant to
their machines (with launching files) onto self-booting 5.25" floppies.
===========================================================================
===========================================================================
BIT BANGER (IIGS Ram Tester, 1993)
by Harold Hislop
This is a sophisticated RAM tester for the IIgs. It performs an
extensive series of tests on RAM, repeating endlessly if instructed to do
so. It appears to be very similar to the RAM tester from Appleworks-GS
(1989, Claris).
Docs are included; they state that the IIgs must first pass the
internal self-test before BIT BANGER can be used. If an accelerator with
more than 128K of cache memory, it must first be disabled. As with all RAM
testers, any information held on a RAM disk will be lost.
These RAM tests are executed: a preliminary overall test, and tests
for stuck bit, nibble, byte, page, bank, and crosstalk errors. A refresh
test is done with a 5 minute delay, to assess whether information is held
accurately for that brief duration. The tests are done sequentially within
each bank, and then sequentially across the banks. Addresses of RAM error
locations are displayed.
Tests are lengthy: testing one meg of RAM will take about 10 minutes
even at accelerated speeds. Overnight burn-in testing is recommended. At
the end of the tests, a colorful scrolling rainbow pattern is displayed.
Before rebooting, the computer must be turned off.
I have not seen BIT BANGER yet confront a bad ram chip, but it
certainly looks impressive with its sequence of clearly identified subtests.
===========================================================================
===========================================================================
CERTIFIX DISK DIAGNOSTICS V. 2.0
=================================
[Opening Menu, CERTIFIX]
RUN CERTIFIX (PRODOS) RUN DRIVE SPEED TEST
RUN CERTIFIX (DOS 3.3) CREATE 40 TRACK 'CERTIFIX'
RUN " RESCUE" CERTIFIX DOCUMENTATION
RUN DRIVE SPEED TEST QUIT TO BASIC
This diagnostic is focused on identifying and locking out any
defective blocks on 5.25" floppies. It also formats disks in either DOS 3.3
or ProDOS, and includes a simple speed tester. The software can also allow
formatting of 40-track Apple II 5.25" floppies. Some disk drives are
capable of 40-track formatting --- most older full-height drives cannot do
this.
With a five minute intensive spin, the drive mechanism assesses the
presence of any bad blocks on the disk surface. Users should keep in mind
that identifying the source of faults is difficult and that persistence is
needed.
============================================================================
=
============================================================================
=
INTERNAL SELF-TEST (IIE, IIC, IIGS)
The internal self-test is available on the enhanced IIe and enhanced
IIc, as well as on all models of the IIgs. It can be retrofitted to older
versions of the IIe or IIc by changing a single ROM chip. This enhancement
is very worthwhile, especially because the test can identify the locations
of faulty RAMs. Replacing faulty RAM chips is especially important for the
IIC, which loses RAMs occasionally due to heat buildup resulting from faulty
ventilation within the CPU.
The self-test is activated by holding down the open-apple and
closed-apple keys at power-up. In the enhanced IIe and enhanced IIc, a
checkerboard pattern appears on the screen for about a minute, changing
slightly every five seconds. If all is well, the checkerboard display is
replaced by the words, "SYSTEM OK" on the screen. When faults are detected,
a cryptic message appears on the screen to identify the fault. Tests are
done on the CPU, MMU, IIc ports, RAM, and others. No message is displayed
when subtests are passed. When a circuit fails, that failure alone is
identified on the screen. Other failures are not identified until the
first-identified failures are corrected.
RAM chips are identified by location, within each 64K bank: the main
64K, and auxiliary 64K. The 8 chips in the main 64K bank are identified on
the screen by the word, RAM followed by eight zeros:
RAM 0 0 0 0 0 0 0 0
Any bad RAM chip is shown by a 1 rather than an 0. If the faulty
RAM is in the auxiliary 64K bank, the display is preceded by an asterisk:
* RAM 0 0 0 0 0 0 0 0
In the IIC, the 16 RAM chips are arranged in a column along the
right edge of the motherboard. The eight RAMs closes to the front (keyboard
end) are main RAM, while the eight RAMs closest to the rear (back panel) are
auxiliary RAM. Positions in the display, counted from the right, represent
motherboard positions counted from the front. For example, consider this
RAM error display:
RAM 0 0 0 0 0 1 0 0
This RAM error message indicates that the THIRD ram in main memory
is faulty ---- the third RAM as counted from the front (keyboard) end of the
RAM column.
The IIGS internal self-test is activated at powerup by holding down
the open-apple and option keys. This self-test takes about two minutes. It
generates a colorful, dynamic display of geometric designs and shapes,
ending with the reassuring message, SYSTEM GOOD. These subtests are
included: RAM, ROM, system speed, serial ports, internal clock, battery RAM,
the desktop bus, interrupts, and possibly other tests.
The internal self-tests are impressive for several reasons.
First, I resurrected two junked IICs which merely had bad RAMs. Locations of the dead RAMs were identified accurately by the self-test. Second, because the self-tests reside in ROM rather than on disk, they are convenient to apply, even if no disk drives are presently connected. Third, they appear to test many motherboard functions. When inspecting hardware, these tests could be valuable to apply before making a decision to buy.
The limitation presented by these tests is that documentation is
difficult or impossible to find. Owners' manuals mention little about them,
and even technical reference manuals on IIgs/IIe/IIc given very scanty
information. The most detailed listing of error codes on the IIgs self-test
is found on an NDA: SUPER INFO III, V.3.0 (1992). The error codes are
listed under the ERR/SELF-TEST pull-down menu. (SUPER INFO III is a $15
shareware item available from its author: Jim Luzar, Apt. 241, 5324 N.
Lovers Lane, Milwaukee WI 53225).
===========================================================================
===========================================================================
MASTER DIAGNOSTICS IIE/IIC, V. 7.0, 1990)
=========================================
(Main Menu Screen: IIc)
MENU OF OPTIONS IIC
1 - ROM TEST 5 - DISK DRIVE ANALYZER
2 - 80 COLUMN TESTS 6 - PORT ANALYSIS
3 - MOUSE SCALE 7 - MONITOR ROUTINES
4 - RAM TESTS H - HELP % - EXIT
(Sub-menu: IIc Ram Test) (Sub-menu: Disk-Drive Analyzer)
* TEST OPTIONS * 1 - DISK READ/WRITE TEST
1 - MOTHERBOARD RAM (AUTO) 2 - DISK SPEED UTILITY
2 - MOTHERBOARD RAM (MANUAL) 3 - WRITE-PROTECT SWITCH TEST
3 - MOTHERBOARD RAM (CONTINUOUS) 4 - HEAD CLEANING UTILITY
5 - RETURN TO MENU
4 - AUXILIARY RAM (AUTO) 6 - REBOOT
5 - AUXILIARY RAM (MANUAL)
6 - AUXILIARY RAM (CONTINUOUS)
7 - RETURN TO MENU
MASTER DIAGNOSTICS IIE/IIC gets my vote for the best all-around
Apple II diagnostics software. There are two separate one-sided 5.25"
disks, each for the IIe and IIc respectively. If the wrong disk is
inserted, a prompt screen will appear. The disks are easy to use, the tests
are extensive and accurate, and they are accompanied by an excellent manual.
The disks are formatted in DOS 3.3, and copy protection was removed from
later versions (Mine are v.7.0, dated 1990). Transitions to the main menu
are smooth and users need not reboot when navigating among menu screens.
The IIe and IIc software must be bought separately: I paid $85 for the IIe
package (1991) and $35 extra to get the IIc version.
Many routines are the best available. Favorites are: Disk Drive
Analyzer, RAM tests, 80 column tests, Port Analysis Tests (IIc only), and
the interface card tests (IIe version only). An older version is available
for the II+, but no IIgs version was ever produced.
DISK DRIVE ANALYZER: Routines are listed above. All are excellent.
These routines would be great for demonstrating a disk drive at the time of
sale. The Write Protect Switch Test is sometimes erratic; that test
sometimes reported false write-switch errors. A HEAD CLEANING UTILITY is
included. This utility sweeps the cleaning disk through all head positions.
A partial run through the head positions will suffice. The IIe version
(but not the IIc version) can initialize scratch disks for the read/write
test and for the disk speed utility.
ROM TEST: This test is excellent. The software knows that ROMs
were expanded in later IIc models, and those roms (D8, D0, E0, E8, F0, F8)
are recognized and tested. Each ROM is identified clearly on the screen as
the test proceeds.
This is the best of all Apple II diagnostics, but it could be
improved. The $85.00 I paid in 1991 was hiked $10.00 above its $75
advertised price; certainly a price-hike should indicate that upgrade
versions are on their way down the pipeline. No update was ever sent or
announced. Customers should be told at time of purchase that updates will
not be available in the future. The lack of disk updates should be
publicized to uses. MASTER DIAGNOSTICS IIE/IIC should have been updated to
allow these tests: 3.5" 800k drives, SCSI hard drives, big RAM cards, ZIP
CHIPS, and other modern interface cards, etc.
===========================================================================
===========================================================================
MECC COMPUTER INSPECTOR V.1.0 (1988)
=======================================
(Main Menu Screen)
COMPUTER INSPECTOR
1. MACHINE IDENTIFICATION 5. RAM MEMORY TEST
2. MONITOR ADJUSTMENT 6. JOYSTICK/PADDLE TEST
3. PRINTER TEST 7. INFORMATION
4. DISK DRIVE TEST 8. QUIT
This diagnostic disk was produced by MECC, a major supplier of
educational software, which is now phasing down its support for the Apple
II. The menu screens resemble those of Master Diagnostics IIe/IIc; they are
well labeled and easily used; no manual is needed. All routines allow
smooth return to the main menu screen; rebooting is unnecessary.
One's first impression on seeing the opening screen is that few
tests are presented. In fact, some of its diagnostics are excellent. This
disk is worth adding to your collection. It is applicable to all late model
Apple IIs: IIgs, IIc, IIc Plus, or IIe.
The best routine on MECC COMPUTER INSPECTOR is MACHINE
IDENTIFICATION. By inspecting the computer's ROMs, this routine deduces the
following information: model number, identity or function of all interface
cards, and identity of all memory (main RAM, auxiliary RAM, and expansion
RAM). IIc ports (corresponding to expansion slots) are identified
correctly. This routine resembles an updated version of the peripheral card
routine on APPLE-CILLIN II, although this routine is more efficient. It
identifies cards and ports accurately, even without manual
pre-identification as required by Apple-Cillin. I was impressed that even
the make and model number of the SCSI hard drive in my flagship IIe was
identified correctly. The only mistake it made in identification is that it
falsely identified my IIc (Unidisk 3.5" model) as a IIc Plus. This error
likely happened because it mistook my Zip Chip 8 MHz accelerator for the
accelerator in the IIc Plus.
The MONITOR ADJUSTMENT option has three subprograms:
(a) normal text and graphics [a mixed test pattern with color
patches, line grids, large type, and a simple graphic].
(b) a super-high resolution graphic [suitable for IIgs only], and
(c) a single-page 80 column text sample screen.
The PRINTER TEST is simple, but good. This test instructs the
printer to reproduce the entire alphabet and supporting symbols.
The DISK DRIVE TEST has an excellent test of the write-protect
switch. Its test of "general operations (write/read to disk) is hard to
evaluate because it gave very little information on my successful tests.
Hopefully, if any drive tests were failed, the faults would have identified.
A drive speed test is included, but its performance was poor relative to
drive speed tests on other diskettes. This drive-speed test is text-based
only, without graphics. It identified the drive speed of all my tested
drives as 300 rpm. These drives are well adjusted for speed, but drive
speed tests on other software identify even slight variations from true
speed, unlike this program.
The RAM MEMORY TEST has a text-based screen. In the IIe/IIe, it
automatically tests main memory (lower 64K), auxiliary memory (upper 64K),
plus any extended memory available. It recognizes and tests all IIgs
memory, taking about ten minutes to test a 4 meg IIgs RAM card. All RAM
tests were passed, so its reporting of RAM failures cannot yet be judged.
An excellent JOYSTICK TEST is included. The user does X-axis and
Y-axis centering on a grid pattern. This adjustment is efficient and
clearly understandable.
Docs, unfortunately, are minimal, consisting of three brief screens.
They cannot be printed. The operating system is proprietary, neither
ProDOS nor DOS 3.3. Thus the routines cannot be split from the package.
The MACHINE IDENTIFICATION routine would be handy to use elsewhere, but it
must remain with the package.
The MECC COMPUTER INSPECTOR program code was reviewed in COMPUTIST
magazine, v 71, p. 17 (1989). The disk can be backed up with the bit copier
on Locksmith v.4.1.
============================================================================= =============================================================================
MULTIRAM IIE OR MULTIRAM IIC DIAGNOSTICS V.2.0 (1985)
CHECKMATE TECHNOLOGY INC.
by Steve Stephenson
(main Menu Screen)
Status
Bank 1 ???K
Bank 2 ???K Bank A
Bank 3 ???K Group: ???K
Bank 4 ???K
-----------------------------------------------------
Bank 5 ???K
Bank 6 ???K Bank B
Bank 7 ???K Group: ???K
Bank 8 ???K
=====================================================
TOTAL ???K
[1] View status page [2] Quit to Basic
Test: [3] Quick [4] Full [5] Continuous
RETURN ARROWS SPACE BAR ESCAPE
starts select pause/resume cancel
These diagnostics specifically test the two Checkmate RAM cards
MultiRam IIe and MultiRam CX (512K for the IIc)
I have the disk, but not the docs. The IIe and IIc tests are on
separate files. The question marks on the opening screen later identify the
RAM capacity when the user returns to the status screen after the tests.
(For the 512K MultiRam CX card in the IIc, each of the eight banks has 64K,
and each Bank Group has 256K.) Of the three test options [3], [4], [5],
option [5] is recommended so that the behavior of the RAMs can be judged
over time.
When the test is selected, an attractive screen appears, outlining
the interface card, and identifying which sockets are filled with RAMs. The
RAMs are each identified as (a) good, (b) good but unusable, or (c)
bad/empty. The test proceeds sequentially across the eight RAM banks. Any
bad/unusable RAMs are easily identified with this graphic display, which
resembles the similar graphic display of AE RAMFACTOR or AE RAMWORKS.
The IIe version, MultiRam Diagnostics IIe, has a further set of
options preceding its opening screen. These options are:
1. MultiRam IIe card (alone)
2. MultiRam IIe (on the RGB)
3. MultiRam RGB card
4. Exit.
I have only the IIc version: MultiRam CX. The IIe version shows a
map of the 32 256K RAM chips in each of the configurations listed above.
Tests on the IIe software will also examine other cards, although
identifying the bad RAM chip ---- the main goal of these programs ---- will
be ambiguous because the RAM maps are specific to these Checkmate cards.
Onboard docs report that the MultiRam IIe and MultiRam RGB cards can be
installed together, yielding a total of 1.75 megabytes of RAM. These tests
could be useful to others in the sense that they will signal whether _any_
RAM is bad; then other tests could be used as follow-up to identify the
location of the bad RAM.
I got the software separately from my used MultiRam CX 512K IIc
board. The disk has these extra programs other than the diagnostics:
MRAM.SYSTEM, MD.PRO.CUSTOM, MULTIDRIVE.PRO, LOGO.SYSTEM, PRINT.DOC,
RAM, and RAM.FILER. The three pages of on-disk v. 4.3 docs can be
selectively viewed on the screen or routed to a slot #1 printer. Mainly,
the docs outline the changes made in the successive versions of the
software.
I received the Checkmate MultiRam diagnostics and related programs on
a nonbootable disk that lacks menus. To simplify their use, I have recopied
these files to a self-booting disk controlled with an excellent program
launcher (Super Selector v.3.22). This disk will be sent to users on
request.
Overall, this software is well arranged and is excellent for those
who have the specific RAM cards for which the software is intended. For
non-MultiRam cards, the software merely tells the user that a chip is bad
without identifying its location clearly.
=============================================================================
=============================================================================
POWER UP! COMPUTER CHECKUP (1984)
William G. Peters, Software Publishing Corp.
This disk is an identical clone of XPS Diagnostics IIe; see the
review of XPS. The disk is copy-protected, and the krack recipe published
in COMPUTIST magazine failed to deprotect it. See the review on XPS.
=============================================================================
=============================================================================
RAM 4000 (RAM-GS TEST v.1.4, c1993)
This is a RAM testing disk supplied with the Chinook RAM 4000 memory
expansion board for the IIgs. It shows an outline drawing the of RAM card,
with its 32 chips clearly identified. These RAM tests are selectable:
standard memory test (regular or extended), memory refresh test, and unique
address test. I have yet to see it identify a failed RAM chip.